X9 Magnetic Properties Analysis System

Description

The X9 Magnetic Properties Analysis System is a computer controlled measurement system capable of fully characterizing thin film magnetic head material without operator involvement. It is easy to use and suitable for both production and development environments. The X9 allows for a totally new approach to process control for magnetic head materials.

The system is designed to accept samples from pre-loaded cassettes of magnetic head monitor coupons. The X9 automatically loads the sample, finds the easy axis, runs high and low field Hysteresis measurements, and high and low field MR measurements. All of the data are sent to a database that can be accessed even while the measurements continue to run.

In a single step, the X9 can determine critical path parameters for magnetic head materials. The system will automatically extract up to 60 magnetic parameters. The Hysteresis measurement will allow for the immediate determination of the Pinned Layer Thickness, Pinned Layer Exchange, Free Layer Thickness, and Free Layer Exchange to determine the effect of coupling between layers. Furthermore, the MR measurements will provide for the immediate extraction of many parameters to determine the transport properties of the material.

The X9 uses industry leading Vector capability. The measurement station contains multiple sensing coils placed optimally to provide data from two axis. The Vector capability is 15X better than most competing technologies using a revolutionary approach to eliminating the error commonly experienced in vector measurements. The ultra precise Vector measurement combined with the ability to automatically make MR measurements allows for multiple measurements from a single source, eliminating the need for multiple tools and saving both cost and space.

The software that provides the interface for the X9 is state of the art and field proven. It is based upon the highly successful EasyVSM software package. The software allows for simple Point-and-Click measurement set up and is accompanied by a powerful data analysis package. In research mode, every facet of the software is available to the user. Researchers can select from a list of measurement wizards, or take control of every aspect of the system in manual measurement set up mode.

Powerful Measurement Capability

EasyVSM-R contains measurement wizards that allow a user to quickly set up a wide variety of common measurements. The wizards allow for point and click programming allowing the user to spend more time analyzing results than collecting them. In addition, more than 60 parameters are available for automatic extraction. These can be selected prior to the measurement or considered later in the data analysis program. In addition to the wizards, a Manual Measurement Setup is available to allow users to program a unique measurement using every capability of the system. Any measurement can be saved for others, such as operators, to run, emailed to other EasyVSM-R users, or run directly after creation.