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Polar Kerr System

  • Polar Kerr System

 

Product Highlights:

  • Within 20 seconds typical, the system measures a full hysteresis loop with up to 16 ,000 measurement points, including graphing, mathematical operations and save to disk.
  • Up to 1024 X,Y locations may be to map properties of the disk and can be saved as individual setup files.
  • The system automatically positions the disk to the measurement location.

Description

ADE Magnetics is introducing its new Polar Kerr system featuring the most important factors of measurement: High field up to 2.5 Tesla, high sensitivity and impeccable stability of magnetic measurements. The Polar Kerr was designed to satisfy the technical need for characterizing the new perpendicular media. This system is fully automated, easy to use, suitable for high-throughput production facilities. ADE Magnetics has developed proprietary techniques which improve the sensitivity and stability of the system.

Fast and Easy to Use

The Polar Kerr System is able to rapidly and automatically generate a map of the magnetic properties of the entire disk. This permits rapid process feedback early to avoid adding expense to disks that may have poor yields. It also provides rapid feedback to the fabrication process, allowing users to make adjustments to the process to improve overall yield.

The Polar System is available both as a low-cost manual-loading tool for use in development or limited-production environments and also as a fully-automated tool for use in volume production. Its unique ability to measure at both high fields and low fields, while providing very fine resolution, makes it a powerful diagnostic tool.

In addition, proprietary extraction software automatically extracts key parameters from the raw data, thus eliminating manual interpretation of the results by operators and test technicians. This feature provides an added degree of consistency to process results and relieves highly-skilled personnel from a time consuming repetitive chore.  

     

Applications for this product

Perpendicular Recording

Sputtering / Process Control

Related products

M2 Disk Mapper

Wafer Mapping System

X9 Magnetic Properties Analysis System

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