Model EV11 VSM

 

Product Highlights:

ADE Magnetics has improved its industry standard VSM, increasing the sensitivity and stability of magnetic measurements. Building on two decades of experience supplying the VSM used by most leading universities, industry laboratories, and production facilities, ADE Magnetics has developed proprietary techniques which improve the sensitivity and stability of the system. This makes the system suitable for performing long-term stability studies of magnetic decay as well as measuring samples with low magnetic signals.

Description

The Model EV11 VSM supports all known magnetic measurements such as Hysteresis and Minor Loops, IRM and DCD Remanence Loops, SFD, Delta M and Henkel Plots, and Angular and AC Remanence Loops. Any series of measurements can be run without user intervention, using the flexible EasyVSM software.

High Accuracy

The high precision stepped field control used in conjunction with Digital Signal Averaging leads to increased accuracy of the measured graphs and measurement parameters, while at the same time facilitating measurements on soft magnetic samples with a field resolution better than 0.01 Oe. Since the field is stepped rather than swept, there is higher accuracy in the field setting and a more precise determination of the coercivity and many other magnetic parameters. The number of data points can be defined by the user. This allows for greater accuracy in areas where detailed data is required or changes in signal are expected.

Fast and Easy to Use

A unique sample vibrating mechanism makes sample mounting and alignment fast and convenient. Using EasyVSM, samples can quickly and easily be aligned properly to maximize the measurement efficiency. The precise aligment techniques provide for excellent accuracy and repeatability.

Three Systems in One

ADE Magnetics offers a unique combination system including Torque and/or Magneto-Resistance (MR) options, which can be added to the VSM without increasing the system footprint and are less expensive than buying separate systems.

The Torque option measures the torque of materials as a function of rotation angle and applied field, resulting in Anisotropy data. The MR option measures the resistance of thin film samples as a function of both magnetic field, temperature and angle. The measurement can be completed in under two minutes even at high resolution.