Magnetometry Product Applications

Magnetics   Anisotropy Disk Media / HDD Easy Axis Dispersion Head Wafer Testing Hysteresis Measurement Magnetic Characterization Magnetic Decay / Viscosity / Time Decay Magnetic Head Testing Magnetic Head Research Magnetic Inks Magnetic Mapping Magnetic Powder / Liquid Magnetic Tapes / Cards Magneto-Optic Measurement Magneto-Optic Materials Magneto-Resistance MRAM Permanent Magnet Perpendicular Recording Rock Magnetism Sputtering / Process Control Temperature Dependent Measurement Torque Measurements Vector Measurements Wafer Mapping Systems

Magnetics Measuring Applications:

ADE Technologies, Inc. Application Notes (.pdf) - *Username and Password Required

• The Performance of the ADE Magnetics Model 10 High Field VSM
• The Impact of System Noise in Low Moment VSM Measurements
• The Importance of Low System Noise in VSM Measurements

Papers (.pdf) - *Username and Password Required
• Getting the Most from Your Vibrating Sample Magnetometer
    - Dennis Speliotis
• Advanced Magnetic Metrology Instrumentation
    - Dennis Speliotis & Mark Willingham

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Anisotropy

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• X9 Magnetic Properties Analysis System -  High Field Automated  Magnetometer
• EV Series VSMs + Vector Option and/or torque option
• Torque Magnetometer

Product Applications

Disk Media / HDD

• M2 DiskMapper
• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, Especially EV7, EV 9 and EV 11
• Torque Magnetometer

Product Applications

Easy Axis Dispersion

• Wafer Mapping System

Product Applications

Head Wafer Testing

• Wafer Mapping System
• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, especially EV5 and EV7

Product Applications

Hysteresis Measurements

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs

Product Applications

Magnetic Characterization

Recording materials and thin film:
• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs
• M2 DiskMapper
• Wafer Mapping System

Product Applications

Magnetic Decay / Viscosity / Time Decay

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs

Product Applications

          Magnetic Head Testing

• X9 Magnetic Properties Analysis System -  High Field Automated  Magnetometer
• Wafer Mapping System
• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs

Product Applications

Magnetic Head Research

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs

Product Applications

Magnetic Inks

• EV Series VSMs Especially EV 5, EV 7

Product Applications

Magnetic Mapping

• M2 DiskMapper

Product Applications

Magnetic Powder / Liquid

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, Especially EV5, EV 7

Product Applications

Magnetic Tapes / Cards

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, Especially EV 7, EV 9

Product Applications

Magneto-Optic Measurements

• Wafer Mapping System

Product Applications

          Magneto-Optic Materials

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, Especially EV9, EV11

Product Applications

Magneto-Resistance

• MR Option - Magneto-Resistance Option for ADE Magnetics VSMs
• EV Series VSMs, Especially EV5, EV7, EV9
• X9 Magnetic Properties Analysis System -  High Field Automated  Magnetometer

Product Applications

MRAM

• MRAM Wafer Mapping System  - Characterization of MRAM Wafers
• X9 Magnetic Properties Analysis System -  High Field Automated  Magnetometer

Product Applications

Permanent Magnets  

 

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, Especially EV11, EV9

Product Applications

       

          Perpendicular Recording

• Polar Kerr System   -  Characterization of Perpendicular Media

Product Applications

 

Rock Magnetism

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, Especially EV7, EV9, EV11

 

Product Applications

Sputtering / Process Control

• M2 DiskMapper
• Wafer Mapping System
• Polar Kerr System   -  Characterization of Perpendicular Media
• X9 Magnetic Properties Analysis System -  High Field Automated  Magnetometer

Product Applications

Temperature Dependent Measurement

• Model 1660-LNA - Liquid Nitrogen / Argon Gas
  Temperature Control System for ADE Magnetics VSMs
• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs,

Product Applications

Torque Measurements

• Torque Magnetometer
• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, Especially EV9

Product Applications

Vector Measurements

• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• X9 Magnetic Properties Analysis System -  High Field Automated  Magnetometer
• EV Series VSMs, Especially EV9

Product Applications

Wafer Mapping

• Wafer Mapping System
• Model 10 VSM - High Field Vector Vibrating Sample Magnetometer
• EV Series VSMs, especially EV5 and EV7

Product Applications

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